Test Conditions: Resonant Field Optimization on 1.8GHz Quad-Core ARM Processor
Date: 4/17/25
Key Findings: 61% reduction in throttling events, 12.8% average clock speed improvement, 1.6% increase in computational work performed
Test Conditions: Temperature monitoring during sustained load
Date: 4/17/25
Thermal Advantages: Average temperature reduction of 2.3°C, peak reduction of 5.7°C, more consistent thermal profile
Test Period: 10 minutes sustained load
Date: 4/17/25
Results: RFO-treated processor completed 1.6% more computational work
Test Period: 10 minutes sustained load
Date: 4/17/25
Key Finding: 61% reduction in throttling with RFO treatment
Test Conditions: 30 minutes exposure (out of circuit), 11 volts with 470 ohm load resistor
Date: 03/09/21
| Time | Experiment Temp (°C) | Control Temp (°C) |
|---|---|---|
| Ambient | 23.2 | - |
| Power Up | - | - |
| 2 min | 24.3 | 25.3 |
| 4 min | 25.1 | 26.2 |
| 6 min | 25.1 | 27 |
| 8 min | 26 | 28.1 |
| 10 min | 26.7 | 29 |
| Power Down | - | - |
| 1 min | 26.2 | 26.9 |
| 2 min | 25.6 | 25.8 |
| 3 min | 25.1 | 25.4 |
| 4 min | 25.2 | 25.2 |
| 5 min | 25.1 | 25.1 |
| 6 min | 24.9 | 24.9 |
| 7 min | 24.7 | 24.8 |
| Ambient (28g/2.0V) | - | - |
| Pass on 2 min | 25.2 | 27.7 |
| 4 min | 26.7 | 28.8 |
| 6 min | 27.1 | 28.5 |
| 8 min | 28 | 30.7 |
| 10 min | 28.7 | 31.2 |
| 12 min | 28.8 | 32.6 |
| 14 min | 28.2 | 31.9 |
| 16 min | 28.2 | 32.1 |
| 18 min | 27.4 | 31.2 |
| 20 min | 24.5 | 24.8 |
| 22 min | 24 | 23.8 |
Test Conditions: Ambient Temperature: 24.1°C
Date: 3/9/25
Test Conditions: 30 minutes exposure, 11V 47ohm load resistor (ambient: 24.9)
Date: 3/11/25
Test Conditions: 2N4401 exposed for 30 minutes 2 days prior
Date: 3/13
Notes: Thermal profile test
Test Conditions: VBC, VCE, and VBE measurements at 5 minutes and Off state
Date: 3/13
Test Conditions: PSU 5V, 1.3 amps
Date: 3/25/05
Test Conditions: VDS test 2 at 4.2V
Date: 3/25/25
Test Conditions: Drain Current @ 5V
Date: 3/25
Test Conditions: 7805 5V linear regulator under load
Date: Test date
Key Finding: RFO-treated regulator maintains consistently lower operating temperature
Test Conditions: RFO-treated MOSFETs vs Control
Date: 3/25
Key Finding: RFO-treated MOSFETs exhibited a lower gate threshold voltage (2.4V) compared to control (3.1V), enabling faster logic switching and more efficient gate operation. VDS under load: Treated ~0.8V vs Control ~0.43V
Test Conditions: 4.2V to 10ohm Switch, tested 35 days after initial exposure
Date: 4/29/25
Key Finding: RFO effects persist with lower temperatures maintained even 35 days after initial treatment
A comparative stress test on a Nvidia GeForce GTX 680 GPU was conducted to evaluate the effects of Resonant Field Optimization (RFO) on system performance and efficiency. Two configurations were tested:
The test measured electrical and thermal behavior under identical workloads to isolate the influence of RFO.
Test Focus: Variation in voltage, power, and current stability
Key Finding: RFO-treated configuration shows superior voltage stability with 16% less variation
Test Conditions: GPU case temperature measured over 10-minute stress test
Key Finding: This indicates that less energy was lost as heat, suggesting improved internal thermal dynamics following RFO exposure.
Control: FPS: 38.9 | Score: 980 | Min FPS: 11.1 | Max FPS: 77.9
Experiment: FPS: 39.2 | Score: 988 | Min FPS: 10.8 | Max FPS: 78.9
Experiment shows performance improvement despite higher power draw and lower operating temperature
RFO exposure produced measurable and consistent improvements in both electrical and thermal efficiency:
Key Indication: RFO is not only non-disruptive, it is actively performance-enhancing.
This latest test reinforces the implications for energy efficiency, heat management, and long-term stability in high-performance GPUs and broader semiconductor systems.
Independent third-party thermal test results validate RFO effectiveness across multiple MOSFET types:
Test Configuration: Source to ground, Gate to 5V, Drain through >10Ω resistor to 5V
Key Finding: All tests showed consistent temperature reduction in RFO-treated devices, with effects ranging from 2.5°C to 6°C lower temperatures compared to control samples.
Test Duration: 18 minutes
Max Temperature Delta: 4.5°C (Control: 52.0°C vs Experiment: 47.5°C)
Average Temperature Reduction: ~3.5°C throughout test
Test Duration: 30 minutes
Max Temperature Delta: 6.0°C at peak (Control: 34.9°C vs Experiment: 28.9°C)
Key Observation: Experiment maintained significantly lower temperature throughout entire test period
Test Duration: 30 minutes
Max Temperature Delta: 6.5°C (Control: 34.9°C vs Experiment: 28.4°C)
Consistency: Results closely match Sample 1, demonstrating repeatability